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S2 PICOFOX

S2 PICOFOX :  spectromètre faisant appel au principe de la spectroscopie à fluorescence X à réflexion totale (TXRF) pour réaliser la micro-analyse quantitative et semi-quantitative rapide d'éléments lourds dans des liquides, suspensions, solides. limites de détection se situant dans les plages ppb et ppm.

Contact : Laurence Motte

Spectrofluorometer Spex FluoroMax Jobin Yvon Horiba

A spectrofluorometer used to obtain fluorescence excitation and emission spectra to quantify characteristics of a fluorophore-containing solution. Spectral Range: 200 to 900 nm.

Contact : Frédéric Geinguenaud

Nano-ZS (Red Badge) ZEN 3600 device (Malvern Instruments, Malvern

The Zetasizer Nano ZS is a high performance two angle particle and molecular size analyzer for the enhanced detection of aggregates and measurement of small or dilute samples, and samples at very low or high concentration using dynamic light scattering with ‘NIBS’ optics. The ZSP also incorporates a zeta potential analyzer that uses electrophoretic light scattering for particles, molecules and surfaces, and a molecular weight analyzer using static light scattering.

Contact : Frédéric Geinguenaud

VersaLab™ 3 Tesla, Cryogen-free Physical Property Measurement System

With a temperature range of 50 – 400K, this 3 tesla platform is perfect for accomplishing many types of materials characterization in a limited space.

Contact : Frédéric Geinguenaud

Bruker Tensor 27 IR

The Bruker Tensor 27 has several accessories that allow for a variety of sample measurements. Solids and liquids can be measure.

Contact : Frédéric Geinguenaud

Thermo Scientific Nicolet 380 FT-IR Spectrometer

The Nicolet 380 FT-IR spectrometer is available for analysis in the mid- IR regions. A real diamond ATR accessory can be easily installed.

Contact : Frédéric Geinguenaud

V-630 UV-VIS Spectrophotometer (Jasco) Kontron and Uvikon 941 Spectrophotometer

Available for analysis over a wide wavelength range of 190 to 1,100 nm, stray light of less than 0.04% and a spectral bandwidth of 1.5 nm.

Contact : Frédéric Geinguenaud